JPH0217602U - - Google Patents

Info

Publication number
JPH0217602U
JPH0217602U JP9768488U JP9768488U JPH0217602U JP H0217602 U JPH0217602 U JP H0217602U JP 9768488 U JP9768488 U JP 9768488U JP 9768488 U JP9768488 U JP 9768488U JP H0217602 U JPH0217602 U JP H0217602U
Authority
JP
Japan
Prior art keywords
carrier
base
amount
top surface
deformation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9768488U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9768488U priority Critical patent/JPH0217602U/ja
Publication of JPH0217602U publication Critical patent/JPH0217602U/ja
Pending legal-status Critical Current

Links

Landscapes

  • A Measuring Device Byusing Mechanical Method (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9768488U 1988-07-22 1988-07-22 Pending JPH0217602U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9768488U JPH0217602U (en]) 1988-07-22 1988-07-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9768488U JPH0217602U (en]) 1988-07-22 1988-07-22

Publications (1)

Publication Number Publication Date
JPH0217602U true JPH0217602U (en]) 1990-02-05

Family

ID=31323318

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9768488U Pending JPH0217602U (en]) 1988-07-22 1988-07-22

Country Status (1)

Country Link
JP (1) JPH0217602U (en])

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